Intern – Realtime Defect Analysis (RDA) Yield Technology

Our vision is to transform how the world uses information to enrich life for all . Micron Technology is a world leader in innovating memory and storage solutions that accelerate the transformation of information into intelligence, inspiring the world to learn, communicate and advance faster than ever. The Realtime Defect Analysis (RDA) Yield Technology team supports advanced DRAM research and development by identifying, analyzing, and reducing manufacturing defects that impact yield and product performance.

The team partners closely with engineers across R&D and High Volume Manufacturing to improve process stability, accelerate learning cycles, and drive continuous improvement through data-driven decision making. As an RDA Yield Technology Intern, you will gain hands-on experience with innovative semiconductor processing, defect inspection systems, and advanced analytical techniques. You will contribute to projects focused on experimentation, defect detection, data analysis, and process optimization while collaborating with multi-functional engineering teams.

This role is ideal for individuals who are passionate about problem solving, root-cause investigation, and leverausingology to improve manufacturing performance.

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